The S-170C is an excellent handler for high volume testing of SOIC devices. The 170D handler is designed to accommodate plunge to board applications and is able to handle many SOIC, TSOP and QSOP package types. The S-170 family of handlers implement easy to use 4 track magazines for input loading and unloading. The Aseco S170 is also designed so that the device under test uses the shortest possible signal path during test to ensure signal accuracy.
