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The S-170C is an excellent handler for high volume testing of
SOIC devices. The 170D handler is designed to accommodate
plunge to board applications and is able to handle many SOIC,
TSOP and QSOP package types. The S-170 family of handlers
implement easy to use 4 track magazines for input loading and
unloading. The Aseco S170 is also designed so that the device
under test uses the shortest possible signal path during test
to ensure signal accuracy.
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Single site or dual site
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Room and hot or tri-temperature
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Standard or plunge to board testing
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SOIC, QSOP, TSOP and similar devices
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